AFM Characterization, Atomic Force Microscopy Imaging Analytical Service
SKU: AFM001
Starting at $300 per sample, MSE Supplies offers professional Atomic Force Microscopy (AFM) characterization services using Bruker Dimension ICON2-SYS AFM or similar instrument.
* Note: Data analysis service is not included in the list prices.
Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.
AFM analysis measures materials surface topography with atomic resolution. It is capable of quantifying surface roughness of samples down to the angstrom-scale. In addition to presenting a surface image, AFM can also provide quantitative measurements of feature sizes, such as step heights and other dimensions. Additionally, advanced modes of AFM allow for the qualitative mapping of various other physical properties, such as adhesion, modulus, dopant distribution, conductivity, surface potential, electric field, and magnetic domains.
Analytical Service Minimum order requirement: $250 per order. A $200 handling fee will be applied if order is below $250.
Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order.
***Please do not ship any samples without authorization from MSE Supplies***