Specification:
General Wafer | |
Diameter | 15 mm x 10 mm (WA0531) ; 50.8 mm (WA0532) |
Thickness | 500 ± 20 μm (WA0531) ; 650 ± 30 (WA0532) |
XRD FWHM |
≤ 150 arcsec |
Surface Roughness | RMS ≤ 3 nm (10 μm × 10 μm) |
Epi Layer |
|
Material | ß-Ga2O3 |
Thickness | 250 ± 50 nm |
Uniformity |
≦ 10% |
Doping |
UID |
Substrate | |
Material | ß-Ga2O3 |
Type/Dopant | N-type / Sn-doped |
Orientation | (001) ± 1° |
Nd-Na | 1E18 - 2E19 cm-3 |