Profilometer Analytical Service

Overview

The profilometer is primarily used to measure the thickness of thin-film materials, assessing their standard properties. It is widely applied in fields such as solar thin-film materials, semiconductor wafers, microelectronic devices, thin-film chemical coatings, and flat panel displays. The instrument plays a critical role in the development and research of new thin-film materials.

As the profilometer's stylus gently glides across the surface of the object being measured, the tiny peaks and valleys on the surface cause the stylus to make slight vertical movements during its motion. These movements reflect the surface profile of the material to a certain extent.

Sample Requirement

• The sample surface should be free of any liquid components, and both the bottom and surface of the sample should be relatively flat with no significant deformation or bending.

• The sample height should not exceed 50 mm.

• Testing is conducted at room temperature by default.

• The primary testing objectives are step height and surface roughness.

* The price on our website is for reference only. 

* Note: Data analysis service is not included in the list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Analytical Service Minimum order requirement: $250 per order. A $200 handling fee will be applied if order is below $250.

Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order. 

***Please do not ship any samples without authorization from MSE Supplies***