Transmission Electron Microscopy (TEM) Analytical Service

Overview

Transmission Electron Microscopy (TEM) is a powerful imaging technique that provides detailed insights into the microstructure, composition, and crystallography of materials at the atomic scale. By transmitting a beam of electrons through an ultra-thin specimen, TEM captures high-resolution images and diffraction patterns, revealing structural information such as crystal orientation, defects, particle morphology, and size. It is widely used in materials science, nanotechnology, and biology to analyze fine structural details that are not visible with light microscopy. The purposes of TEM testing are varied, with common objectives including:

1. Observing Crystal Structure: TEM can use electron diffraction techniques to examine the crystal structure of materials, providing information on lattice constants, crystal orientation, and crystal defects.

2. Analyzing Composition: TEM can analyze the composition of materials through energy-dispersive X-ray spectroscopy (EDS) or electron energy loss spectroscopy (EELS), identifying the types and quantities of elements present.

3. Studying Morphology and Size: TEM can observe the morphology and size of materials, including information on particle shape, size, and distribution.

4. Investigating Interfaces and Interface Reactions: TEM can examine the structure of interfaces and interface reactions within materials, such as grain boundaries, phase boundaries, and interface reaction products.

MSE TEM analytical service is suitable for both powder and bulk samples, including magnetic and non-magnetic materials. Bulk samples can be prepared for testing. Capabilities include diffraction, spectroscopy, mapping, STEM, and electron energy loss spectroscopy (EELS).

Sample Requirement

1. Sample State

Powder and liquid samples are suitable for testing. Thin films and bulk materials cannot be directly tested and require sample preparation methods such as ion thinning, twin-jet polishing, FIB, or sectioning. Please specify and confirm the required preparation in advance.

2. Sample Composition Requirements

This guidance applies specifically to materials testing; biological samples are treated differently. Typically, the following requirements apply to test samples:

• Safety: Samples must be non-toxic and non-radioactive.

• Organic Content: Organic compounds are unstable under high vacuum and can easily disintegrate during imaging, potentially contaminating the instrument. If imaging is necessary, please confirm with the staff. Note that samples containing organic matter cannot be used for mapping; avoid selecting this option during booking.

• Magnetism: Magnetic particles are prone to adhere to the pole piece, and, in principle, magnetic samples are not imaged with electron microscopes (SEM and TEM). However, different equipment and staff experience may accommodate varying levels of magnetism in samples. Please accurately indicate the presence and strength of magnetism in your sample when booking.

To help distinguish magnetic properties, magnetic samples are defined as follows:

• Magnetic Samples: Samples containing magnetic elements such as Fe, Co, Ni, Mn are considered magnetic. Note that magnetism can be categorized as hard or soft; some materials may not exhibit magnetism externally but are easily magnetized under an external field or when heated. These are also considered magnetic.

• Strongly Magnetic: Samples that can be picked up by a magnet.

• Weakly Magnetic: Samples that a magnet cannot lift but meet the above definition of magnetic properties.

3. Choice of Copper Grid

• Standard morphology samples generally use a copper grid; for high resolution, ultrathin carbon film or microgrids are recommended.
• For sheet samples or particles larger than tens of nanometers, a microgrid can be used for high resolution (microgrids have no substrate and are hollow in the center).
• For samples smaller than 10 nm, microgrids are not recommended, as they may not capture the sample.
• Quantum dots or small particles around 10 nm should use ultrathin carbon film, although it may not provide the best contrast. For mapping C elements, use a microgrid and ensure that the sample

* The price on our website is for reference only. 

* Note: Data analysis service is not included in the list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Analytical Service Minimum order requirement: $250 per order. A $200 handling fee will be applied if order is below $250.

Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order. 

***Please do not ship any samples without authorization from MSE Supplies***