X-ray reflectivity (XRR) Analytical Service

X-ray reflectivity (XRR) is an analytical technique used to study thin layer structures, surfaces, and interfaces using the total external reflection effect of X-rays. The reflectometer is used to characterize single-layer and multi-layer structures and coatings in magnetic, semiconductor, and optical materials.

In a reflection experiment, the X-ray reflection of the sample is measured around the critical angle. At each interface where the electron density changes, part of the X-ray beam is reflected. From these reflection curves, layer parameters such as thickness, density, interface and surface roughness can be determined, regardless of the crystallinity of each layer (single crystal, polycrystalline, or amorphous).

MSE Analytical Services offer professional X-ray reflectivity (XRR) analytical services using Smart lab or similar instrument.

* Note: Data analysis service is not included in the list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order. 

***Please do not ship any samples without authorization from MSE Supplies***