Electron Back Scatter Diffraction (EBSD) Analytical Service

Electron Back Scatter Diffraction (EBSD) is one of the accessories of the scanning electron microscope (SEM). EBSD uses backscattered electron diffraction to obtain crystallographic information such as intercrystalline orientation, grain boundary type, recrystallized grains, microtexture, phase discrimination and grain size measurement.

In EBSD, a stationary electron beam interacts with a tilted crystalline sample and the diffracted electrons form a pattern that can be detected with a fluorescent screen . The diffraction pattern is characteristic of the crystal structure and orientation at the point (or volume) where the electron beam interacts with the sample. 

MSE Analytical Services offer professional EBSD analytical services using BEDAX-TSL, Nordly max3 or similar instrument.

* Note: Data analysis service is not included in the list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order. 

***Please do not ship any samples without authorization from MSE Supplies***