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MSE PRO Profilometers for Optics Surface
SKU: MA2229
MSE PRO™ Profilometers for Optics Surface
MSE PRO™ Profilometers for Optics Surface is a versatile measurement solution designed for the optical lens industry. It can measure both surface roughness and profile in a single scan. The profilometer includes a dedicated software module for the measurement and analysis of large aspheric surfaces, making it ideal for optical lens applications.
Additionally, this profilometer is suitable for measuring the profile and roughness of large, curved surfaces, such as bearings, artificial joints, precision molds, gears, and blades. This versatility makes it widely used in precision machining, automotive, bearings, machine tools, molds, precision hardware, and other industries.
Product Features:
- Simultaneous profile and roughness parameter evaluation from a single scan.
- Superior precision, stability, and repeatability.
- Specialized aspheric optical software module.
- Advanced software analysis system with intelligent management.
- Built-in intelligent protection system for safe scanning.
- User-friendly manual control options.
- High-performance vibration isolation system for enhanced stability.
MSE Supplies offers various optical metrology instruments. Please contact us for more information.
Specifications:
| SKU# | MA2229 | ||
| Profile Measurement |
Measuring Range |
X | 0~100 mm |
| Z | 0~300 mm | ||
| Z1 | ±6 mm (Optional: ±12 mm) | ||
| Resolution | 0.001 um | ||
| Accuracy | Z1 | ≤ ± (0.5+0.03 H) μm (H, mm) | |
| Pt | Pt ≤0.2 μm | ||
| Standard Balt | ≤ ± (1+R/20) μm (R, mm) | ||
| Angle | ≤ ±1' | ||
| Moving Speed | X | 0~20 mm/s | |
| Z | 0~20 mm/s | ||
| Scanning Speed | 0.05～5 mm/s | ||
| X Straightness | ≤0.15 μm/100 mm | ||
| Measuring Force | 0.5 mN, 0.75 mN, 1 mN, 2 mN, 3 mN (Adjustable) | ||
| Roughness Measurement |
Ba Measurement Range | Ra 0.012 μm ~ Ra 12.5 μm | |
| Accuracy |
Ra 0.012 μm～Ra 3.2 μm: ≤ ± (3 nm+2.0% A), A(Ra) μm Ra 3.201 μm～Ra 12.5 μm: ≤ ± (3 nm+3.5% A), A (Ra) μm |
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| Repeatability(1σ) | 18 ≤ 1 nm | ||
| Measurement Residual | Rq ≤ 3 nm | ||
| Filter | Gaussian filter, 2RC filter, zero phase filter | ||
| Sampling Length | 0.008, 0.08, 0.25, 0.8, 2.5, 8.0 or 25 mm Selectable | ||
| Evaluation Length | Auto calculation | ||
| Size (L×W×H) | 600×350×890 (mm) | ||
| Weight | 195 kg | ||