Focused Ion Beam Scanning Electron Microscopy (FIB Sample Preparation/FIB + SEM/FIB + TEM/FIB + Spherical Aberration Correction)

Overview

FIB uses electrostatic lenses to focus an ion beam into a very small size to bombard the material's surface, enabling material removal, deposition, implantation, cutting, and modification. For different materials, such as metals, rocks, and lithium batteries, it can achieve targeted cross-sectional morphology and composition characterization, TEM sample preparation, micro/nano-structure processing, serial-section 3D reconstruction, and 3D atom probe sample preparation.

Sample Requirement

• Non-volatile, solid, and bulk samples should ideally have a length and width less than 20 mm, with a height less than 5 mm.

• Samples must have good conductivity; if the conductivity is poor, gold or carbon coating is required.

• For transmission sample preparation, only the thickness of the cut sample is guaranteed to be suitable for transmission imaging.

* Note: Data analysis service is not included in the list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Analytical Service Minimum order requirement: $250 per order. A $200 handling fee will be applied if order is below $250.

Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order. 

***Please do not ship any samples without authorization from MSE Supplies***