Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) Analytical Service

TOF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is a highly sensitive measurement technique that uses primary ions to excite the surface of a sample, ejecting trace amounts of secondary ions. By measuring the time it takes these secondary ions to reach the detector, depending on their mass, TOF-SIMS provides extremely high-resolution mass analysis.

Report Example

1. Mass Spectrometry + Analysis

• Mass Spectrometry Testing: Only provides corrected images and TXT data.
• Mass Spectrometry + Data Processing: Provides corrected images and a full list of assigned ion peaks.

2. Surface Scanning + Analysis

Exports the MAPPING of ions specified by the customer, with all ions displayed in Thermal colors: the color scale on the right shows that black represents areas with no distribution, while yellow and white indicate areas with higher distribution.

3. Depth Profiling + Data Analysis

Instrument Model: TOF-SIMS 5 iontof—Alternate Dual Mode—Depth Profiling

Depth Profile—Corresponding 3D Image

* Note: Data analysis service is not included in the list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Analytical Service Minimum order requirement: $250 per order. A $200 handling fee will be applied if order is below $250.

Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order. 

***Please do not ship any samples without authorization from MSE Supplies***