Overview

It can achieve sub-angstrom resolution and is commonly used for precise characterization of nanomaterials to obtain information on atomic arrangements, microstructure, and elemental distribution. High-resolution images (HRTEM), single-atom images, HAADF (high-angle annular dark field), EELS (electron energy loss spectroscopy), and mapping are obtainable.

Morphology Observation: Provides two-dimensional microscopic morphology observation of the internal microstructure of various materials, including common powder and nanoparticle morphology and particle size observation. Combined with 3D reconstruction, it enables three-dimensional morphology visualization.

Structural Analysis: Uses selected area electron diffraction, high-resolution transmission images, and high-resolution scanning transmission images to analyze the structure of materials.

Composition Analysis: Combined with an energy dispersive spectrometer, it enables point, line, surface, and volume elemental distribution analysis of samples, providing atomic resolution elemental mapping images.

Sample Requirement

For bulk samples, prepare with FIB to a thickness of around 30 nm; provide approximately 10 mg for powdered samples.
For nanoparticles or nanosheets, it is recommended to use microgrids or ultra-thin carbon films for sample preparation.
Samples containing magnetic elements must be provided in powdered form to verify magnetism.

* Note: Data analysis service is not included in the list prices.

Highlights: High Quality Data, Competitive Pricing, Technical Support by Scientists.

Analytical Service Minimum order requirement: $250 per order. A $200 handling fee will be applied if order is below $250.

Please contact sales@msesupplies.com for additional information and instructions on our Analytical Services program. Confirmation of the sample(s) requirements, SDS sheets and additional information is needed prior to processing the Analytical Service order.

***Please do not ship any samples without authorization from MSE Supplies***

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